Albert Djikeng

MIT Department: Electrical Engineering and Computer Science

Undergraduate Institution: University of Texas, San Antonio

Faculty Mentor: Duane Boning

Website: LinkedIn

2018 Research Poster


I was born and raised in Douala, Cameroon and immigrated to the U.S at the age of seven. I lived in Gaithersburg, Maryland (where he learned to speak English) for two years before moving to Houston, Texas. I am a junior at the University of Texas at San Antonio (UTSA) studying computer engineering with a minor in computer science. My research interests include fiber optic communications and engineering management,as I ultimately plan to create a technology firm that provide basic IT services to, and invests in, start-up companies across Africa.

2018 Research Abstract

Modeling the Impact of Photonic Device Variation on a Photonic Data-Link Circuit

Albert Djikeng1, Duane Boning, PhD2, Zhengxing Zhang3, and Chris Lang4

1Department of Electrical and Computer Engineering, University of Texas at San Antonio

2,3,4Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology  

Fabrication standards for photonic integrated circuits (PICs) are vital to the future of microphotonics in order to achieve both mass production and chip functionality. One of the greatest challenges towards the progression of high product yield is the lack of standardized models for fabrication variations. Throughout the manufacturing process of PICs, variations such as changes in waveguide width and thickness occur and may contribute to decreased overall performance of the chip. Here, we address this challenge by developing a compact variational model of photonic components, and then analyzing the impact of these component variations through simulations of a high speed photonic data link. We focus on discrepancies in ring resonator width and thickness and model their effects as a function of applied DC voltage and refractive index of the silicon waveguides. Impact of variation using these compact models on resulting eye diagrams and Bit Error Rate (BER) will show that our approach enables use of component level variation analysis to understand the impact on a full-link photonic circuit.